gTESTER-100 - Tester for Analog and digital PWAs
gTESTER-100 is the ultimate in Analog / Digital PWA Functional Test device with features that are only found in high-end Automated Test Equipment (ATE) systems. It offers Card Edge functional test of analog and digital PWAs and Boundary Scan Tests for PWAs with JTAG compatible chips. Custom or third party software can be also used for testing and guided probe back tracking.
The product caters to functional test scenario (end to end requirement based functional testing as very relevant to Aerospace where certification requires 100% requirement coverage in testing). To support such functional testing, it requires ability to change all the inputs simultaneously in normal and abnormal conditions, simulating the working envelop of the environment, in which the electronic module (the unit under test) works with reference to all parameters as specified, with adequate fidelity of simulation.
gTESTER provides an optimum platform for supporting functional testing of complex subsystems modules implemented with one or more processors and multiple programmable logic devices along with analog I/O. It has the flexibility to control the inputs dynamically simulating the environment of operation with adequate level of fidelity. gTESTER has a direct control architecture implementation where command from host through com port (or manual commands from control panel) is received along with outputs from the unit under test and provides inputs to Unit Under Test (UUT) dynamically using simulation logic implemented within.
A direct implementation using a single HW module simplifies the design giving cost advantage and compactness. Further VHDL based simulation ensures high level of flexibility and removes restrictions and delays caused by bus communication.
gTESTER can be directly interfaced to the PC using the serial port, hence freedom from obsolescence of PC interfaces and hardware.
- 100 programmable discrete I/Os. with 3.3 V / 5 V logic level
- 16 AO and 16 AI channels.(+/-5 volts)
- 17 manual inputs
- 45 Mode selection switches
- 23 channel visual output monitoring (LED)
- 200 channel monitoring points
- Automatic mode (with PC host using serial link)
- Unlimited number of virtual test pins for contact-less testing using boundary scan test
- Programmable Time base or special pulse train generation from 20ns (50MHz) to 1 sec in steps of 20 nanoseconds
- Card Edge functional test for Analog / Digital PWAs
- Programmable Digital Simulator
Successfully used for testing complex digital PWBs (containing multiple DSPs, multiple million gates FPGAs)
- Ability to configure digital inputs to PWA under test depending on the specific requirements of the PWA (example the if the PWA is a controller circuit, the response feedback from the controlled system can be accurately modeled and fed to the PWA enabling realistic functional testing) This flexibility is provided using VHDL based programmable digital I/O
- Higher level of integration enables compact design
- Modular integrated design allows easy customization
- Future proof designing by using programmable devices which can be easily replaced with a future version device and generic communication protocols like serial port
- Optimized design to provide acceptable no-frills performance at affordable price
